| dc.contributor.author | Lojenaa, N. | |
| dc.contributor.author | Scanlon, M. | |
| dc.contributor.author | Le-Khac, N.A. | |
| dc.contributor.author | De Zoysa, K. | |
| dc.contributor.author | Sayakkara, A.P. | |
| dc.date.accessioned | 2025-05-08T06:54:12Z | |
| dc.date.available | 2025-05-08T06:54:12Z | |
| dc.date.issued | 2024-03-15 | |
| dc.identifier.citation | Navanesan, L., Le-Khac, N.A., Scanlon, M., De Zoysa, K. and Sayakkara, A.P., 2024. Ensuring cross-device portability of electromagnetic side-channel analysis for digital forensics. Forensic Science International: Digital Investigation, 48, p.301684. | en_US |
| dc.identifier.uri | http://drr.vau.ac.lk/handle/123456789/1162 | |
| dc.description.abstract | Investigation on smart devices has become an essential subdomain in digital forensics. The inherent diversity and complexity of smart devices pose a challenge to the extraction of evidence without physically tampering with it, which is often a strict requirement in law enforcement and legal proceedings. Recently, this has led to the application of non- ntrusive Electromagnetic Side-Channel Analysis (EM-SCA) as an emerging approach to extract forensic insights from smart devices. EM-SCA for digital forensics is still in its infancy, and has only been tested on a small number of devices so far. Most importantly, the question still remains whether Machine Learning (ML) models in EM-SCA are portable across multiple devices to be useful in digital forensics, i.e., cross-device portability. This study experimentally explores this aspect of EM-SCA using a wide set of smart devices. The experiments using various iPhones and Nordic Semiconductor nRF52-DK devices indicate that the direct application of pre-trained ML models across multiple identical devices does not yield optimal outcomes (under 20 % accuracy in most cases). Subsequent experiments included collecting distinct samples of EM traces from all the devices to train new ML models with mixed device data; this also fell short of expectations (still below 20 % accuracy). This prompted the adoption of transfer learning techniques, which showed promise for cross-model implementations. In particular, for the iPhone 13 and nRF52-DK devices, applying transfer learning techniques resulted in achieving the highest accuracy, with accuracy scores of 98 % and 96 %, respectively. This result makes a significant advancement in the application of EM-SCA to digital forensics by enabling the use of pre-trained models across identical or similar devices. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.source.uri | https://www.sciencedirect.com/science/article/pii/S2666281723002032 | en_US |
| dc.subject | EM-SCA | en_US |
| dc.subject | Cross-device portability | en_US |
| dc.subject | Digital forensics | en_US |
| dc.subject | Smart devices | en_US |
| dc.subject | Deep-learning | en_US |
| dc.subject | Side-channel analysis | en_US |
| dc.title | Ensuring cross-device portability of electromagnetic side-channel analysis for digital forensics | en_US |
| dc.type | Journal article | en_US |
| dc.identifier.doi | https://doi.org/10.1016/j.fsidi.2023.301684 | en_US |
| dc.identifier.journal | Forensic Science International: Digital Investigation | en_US |